Journal publications

1. Anis Nazer, Ali Chehab, Ayman Kayssi "Dynamic Current Testing For CMOS Domino Circuits" , International Journal of Electronics, 2007

Conference papers

1. Froukh, Tawfiq Nafie, Omar Hait, Sana Laugwitz, Lucia Sommerfeld, Julia Sturm, Marc Baraghiti, Aya Issa, Tala Al-Nazer, Anis Koch, Philipp Hanselmann, Johannes Kootz, Beate Bauer, Peter Al‐Ameri, Wael Abou Jamra, Rami Alfrook, Ayman Hamadallah, Moath Soufan, Linda Riess, Angelika Buchert, Rebecca. (2020). Genetic basis of neurodevelopmental disorders in 103 Jordanian families. Clinical Genetics. 97. 10.1111/cge.13720.
2. Anis Nazer, Ali Chehab, Ayman Kayssi "Dynamic Current testing for CMOS Domino Circuits", Midwest Symposium on Circuits and Systems, 2006
3. Anis Nazer, Ali Chehab, and Ayman Kayssi, and Rafic Makki. "Evaluation of IDDT testing for CMOS domino circuits",IEEE International Workshop on Current and Defect Based Testing, DBT 2005.
4. Najwa Aaraj, Anis Nazer, Ali Chehab, and Ayman Kayssi. "Transient Current Testing for Dynamic CMOS Circuits", IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004.
5. Ali Chehab, Ayman Kayssi, Anis Nazer, Najwa Aaraj "Transient Current Testing of Dynamic CMOS Circuits in the Presence of Leakage and Process Variation" Intrnational Conference on Microelectronics, 2004
6. Ali Chahab, Ayman Kayssi, Anis Nazer and Rafic Makki, "Improved Method for iDDT Testing in the Presence of Leakage and Process Variation", IEEE International Workshop on Current and Defect Based Testing 2004.